Nanocalorimétrie
Nanocalorimetry is a technique developed by Leslie H. Allen's group at the University of Illinois at Urbana-Champaign. I was part of this group as a postdoc in 1999-2000 and then started developing the technique with my students at the Université de Montréal to look namely at damage annealing of low-energy ion-implanted silicon.
Nanocalorimetry is a thin-film equivalent of Differential Scanning Calorimetry (DSC) that can measure the heat associated with reactions or transformations occurring in ultra-thin films, that is, layers of the order of a monolayer or less. It is thus a valuable tool to investigate in situ the evolution of thin-films and nanostructures from a thermal point-of-view.
Recently, our group successfully developed a nanocalorimeter comprising a thin layer of mono-crystalline Si on its surface. This device opens the door for calorimetric measurements to be made on a pure, atomically ordered, and well documented surface. This includes measuring the heat exchanges during the initial phases of thin layer growth, the formation of self-assembled nanostructures of semiconductors and organic materials, solid-state reaction in ultra-thin films, catalytic processes, etc.
Here are some contributions regrouped by subject:
Description of the technique, fabrication and calculation method
- Y. Anahory, M. Guihard, D. Smeets, R. Karmouch, F. Schiettekatte, Ph. Vasseur, P. Desjardins, Liang Hu, L.H. Allen, E. Leon-Gutierrez, J. Rodriguez-Viejo, Fabrication, characterization and modeling of single-crystal thin film calorimeter sensors, Thermochim. Acta 510 (2010) 126.
- R. Karmouch, J.-F. Mercure, F. Schiettekatte, Nanocalorimeter fabrication procedure and data analysis for investigations on implantation damage annealing, Thermochim. Acta 432 (2005) 186.
- M. Yu. Efremov, E. A. Olson, M. Zhang, S. L. Lai, F. Schiettekatte, Z. S. Zhang, L. H. Allen, Thin-film differential scanning nanocalorimetry: heat capacity analysis, Thermochimica Acta 412 (2004) 13.
- M. Yu. Efremov, E. A. Olson, M. Zhang, S. L. Lai, F. Schiettekatte, Z. S. Zhang, L. H. Allen, Ultra-sensitive, fast, thin-film differential scanning calorimeter, Rev. Sci. Instr. 75 (2004) 179.
Damage annealing
- L.K. Béland, Y. Anahory, D. Smeets, M. Guihard, P. Brommer, J.-F. Joly, J.-C. Pothier, L.J. Lewis, N. Mousseau, F. Schiettekatte, Replenish and Relax: Explaining Logarithmic Annealing in Ion-Implanted c-Si, Phys. Rev. Lett. 111 (2013) 105502
- R. Karmouch, Y. Anahory, J.-F. Mercure, D. Bouilly, M. Chicoine, G. Bentoumi, R. Leonelli, Y.Q. Wang, F. Schiettekatte, Damage evolution in low-energy-ion implanted silicon, Phys. Rev. B75 (2007) 075304
- J.-F. Mercure, R. Karmouch, Y. Anahory, S. Roorda, F. Schiettekatte, Structural relaxation of amorphous silicon depends on implantation temperature, Phys. Rev. B 71 (2005) 134205.
- R. Karmouch, J.-F. Mercure, Y. Anahory, F. Schiettekatte, Concentration and ion energy independent annealing kinetics during ion implanted defects annealing, Appl. Phys. Lett. 86 (2005) 031912.
- R. Karmouch, J.-F. Mercure, Y. Anahory, F. Schiettekatte, Damage annealing process in implanted poly-silicon studied by nanocalorimetry: effects of heating rate and beam flux, Nucl. Instr. Meth. B241 (2005) 341
- J.-F. Mercure, R. Karmouch, S. Roorda, F. Schiettekatte, Y. Anahory, Radiation damage in silicon studied in situ by nanocalorimetry, Physica B 340-342 (2003) 622.
Melting point depression
- M.Yu. Efremov, F. Schiettekatte, M. Zhang, E.A. Olson, A. T. Kwan, R.S. Berry, L.H. Allen. Discrete Periodic Melting Point Observations for Nanostructures Ensembles, Phys. Rev. Lett. 85 (2000) 3560.
- M. Zhang, Yu. Efremov, F. Schiettekatte, E.A. Olson, A. T. Kwan, S.L. Lai, T. Wisleder, J. E. Greene, L.H. Allen. Size-dependent melting point depression of nanostructures: Nanocalorimetric measurements, Phys. Rev. B62 (2000) 10548.
Other applications
- M. Molina-Ruiz, A. F. Lopeandía, M. González-Silveira, Y. Anahory, M. Guihard, G. Garcia, M. T. Clavaguera-Mora, F. Schiettekatte, J. Rodríguez-Viejo, Formation of Pd2Si on single-crystalline Si (100) at ultrafast heating rates: An in-situ analysis by nanocalorimetry, Appl. Phys. Lett. 102 (2013) 143111
- L. Hu, L. de la Rama, M. Efremov, Y. Anahory, F. Schiettekatte, L. H. Allen, Leslie, Synthesis and Characterization of Single-Layer Silver-Decanethiolate Lamellar Crystals, J. Amer. Chem. Soc. 133 (2011) 4367
- A.T. Kwan, M.Yu. Efremov, E.A. Olson, F. Schiettekatte, M. Zhang, P.H. Geil L.H. Allen. Nanoscale calorimetry of isolated polyethylene single crystals, J. Polymer Sci. B39 (2001) 1237.
- E. A. Olson, M. Yu. Efremov, A.T. Kwan, S. Lai, V. Petrova, F. Schiettekatte, J. T. Warren, M. Zhang, and L. H. Allen. Scanning calorimeter for nanoliter-scale liquid samples, Appl. Phys. Lett. 77 (2000) 2671.